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Thin Film Characterisation

Our product range includes a wide range of led tester, manipulator system and hall effect measurement system.

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Product Details:
UsageLaboratory, Industrial
CIE Color CoordinatesMeasuring Dominant Wavelength (Coordinates x, y)
Power SourceElectric
Voltage220 V
Frequency50/60 Hz
DisplayLED

LED Tester is good to measure both electrical (I-V curve) and optical(Spectra, Light intensity) properties of the LED chip, LED lamp, SMD type at the same time.

Features:

  • Measuring both electrical and optical properties at the same time.
  • Optical focus system was attached to the microscope and it made possible to measure accurate light intensity(mcd) and optical power(mW).
  • Current versus Voltage plotting graph, Current versus Light Intensity plotting graph.
  • Accurate spectrum analysis by certified Spectrometer.
  • PC Interface with S/W.
  • Compact desktop design, and powerful performance.
  • The LED tester can be installed with probe station that the customer already has.

 

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Product Details:
UsageLaboratory
X Y Z Travel10x10x10 mm
Resolution3 um
Leakage CurrentLess Than 300 A
FixtureMagnet Fixture or Vacuum Fixture (ON/OFF Switch)
Manipulator System is an accurate system that probe micro distance() and contact on the electrode of the semiconductor wafer, device. The manipulator is very easy to use and probe arm’s elastic plate is good to protect sample’s surface, from being damaged by Z-direction movement.


Features:

  • Probe arm fixture by screwing bolt.
  • Leakage current level.
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Product Details:
ApplicationLaboratory
Display TypeLED
Six Stage of Current Ranges to Constant Input Current1nA ~ 20mA
Can Test Various SizeSample 5 mm x 5 mm ~ 30 mm x 30 mm
Max Thickness5.5 mm
Hall Effect Measurement System is used for measuring Carrier Concentration, Mobility, Resistivity and Hall Coefficient in order to grasp the electrical specifications of the semiconductor device.

Our HMS series consists of the constant current source, terminal conversion system by Van der Pauw technique, low temperature(77K) test system, and magnetic flux density input system.

Features:

  • Materials for Measurement Si, SiGe, SiC, GaAs, InGaAs, InP, GaN, TCO (including ITO), AlZnO, FeCdTe, ZnO.
  • Measurements Done
  • Data Index Bulk, Sheet Carrier Concentration
  • Resistivity
  • Mobility, Hall Coefficient
  • Magneto resistance
  • Alpha (Vertical/Horizontal ration of resistance)
  • Sample Structure 3D of Measurement Sample
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Dynotech Instruments Private Limited

Koshy Mathew(Manager Sales)
803-804, Vishwa Sadan, District Center
Janakpuri, Delhi - 110058
India
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